Preview

Publication Date

11-29-2013

Michael N. Spilde, Manager, Microbe/SEM Facility, Institute of Meteoritics, UNM, 277-5430, mspilde@unm.ed

Image Type: SEM Image, Scale Bar: 20 um, Magnification: 2000, Etch: Etched, Coating: Au/Pd, kV: 15, Spot Sz: 7.

filament, smooth, spheroid, film

COinS