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Publication Date

11-22-2010

Michael N. Spilde, Manager, Microbe/SEM Facility, Institute of Meteoritics, UNM, 277-5430, mspilde@unm.ed

Image Type: SEM Image, Scale Bar: 20 um, Magnification: 2200, Etch: No etching, Coating: Au/Pd, Instrument Location: UNM, kV: 15 kV, Spot Sz: 7.

filament, reticulated, crystal, debris, etched

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