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Publication Date

11-29-2013

Michael N. Spilde, Manager, Microbe/SEM Facility, Institute of Meteoritics, UNM, 277-5430, mspilde@unm.ed

Image Type: SEM Image, Scale Bar: 10 um, Magnification: 3500, Etch: Etched, Coating: Au/Pd, kV: 15, Spot Sz: 6.

film, filament, concentric, crystal, bridging

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