Electrical and Computer Engineering ETDs
Publication Date
Summer 7-29-2025
Abstract
Application Specific Integrated Circuit (ASIC) designs continue to scale with ever increasing complexity and device counts in the billions. Demand for scalable high-fidelity simulations of these systems drives the need for the development of novel modeling capabilities. This research formulates a non-intrusive model order reduc-tion (MOR) framework, called PUF-ROMS, to accelerate and optimize the design and analysis of physical unclonable functions (PUFs) on ASICs. The primary goals of PUF-ROMS are to estimate entropy and temperature-voltage noise (TV-noise) of circuit structures used in the design in an accelerated evaluation environment to enable designers to explore architecture options with the goal of maximizing entropy and minimizing the adverse impact of TV-noise on accessing this entropy. PUF-ROMS starts with the development of reduced order models (ROMs) for the logic cell primitives used in the PUF circuit structure. The cell primitive ROMs are then used in SPICE system-level Monte Carlo (MC) simulations to enable efficient exploration of the PUF design space, including improvements in both utility and performance.
Keywords
Cryptography, PUF, Machine Learning, Semiconductor Device Modeling, Hardware Security, Reduced Order Modeling
Sponsors
Sandia National Laboratories
Document Type
Dissertation
Language
English
Degree Name
Computer Engineering
Level of Degree
Doctoral
Department Name
Electrical and Computer Engineering
First Committee Member (Chair)
Jim Plusquellic
Second Committee Member
Payman Zarkesh-ha
Third Committee Member
Eirini Tsiropoulou
Fourth Committee Member
Biliana Paskaleva
Fifth Committee Member
Mitchell Martin
Recommended Citation
Wilcox, Ian Z.. "Optimization and Acceleration of PUF Design through Reduced Order Standard Cell Modeling." (2025). https://digitalrepository.unm.edu/ece_etds/727