Electrical and Computer Engineering ETDs

Publication Date

Summer 7-8-2024

Abstract

Secondary electron emission (SEE) from conductors is thought to play an important role in the initiation of Multipactor breakdown in vacuum electron devices. The SEE of dielectric materials plays a crucial role in numerous scientific and technological applications, including particle accelerators, spacecraft charging, and plasma diagnostics. Additionally, the SEE of an insulator may depend on its electrical stress history. In both cases, SEE strongly depends on any conditioning of the material surface. We present measurements on both conducting and insulating materials of interest in these applications. Measurements are being made in an existing test stand, recently modified to enable measurements on insulators as well as conductors. The system utilizes a hemispherical current collector placed above the sample to collect secondary electrons. Primary electrons are supplied by a < 3 uA, 0 – 1000 eV electron gun. A recent measurements of SEE of dielectric materials under investigation for reduced SEE and improved flashover resistance will be presented

Document Type

Thesis

First Committee Member (Chair)

MARK GILMORE

Second Committee Member

SALVADOR PORTILLO

Third Committee Member

EDL SCHAMILOGLU

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