Electrical Parameter Correlations For Radiation Hardness Assurance Of Operational Amplifiers

Author

John L. Mullis

Publication Date

5-1973

Abstract

In the manufacture of integrated circuits, a consider­able amount of attention is given to controlling fabrication processes. This is required if high production yield and consistent quality are to be obtained. In addition to moni­toring critical parameters which are influenced by variables in processing, the packaged circuits undergo a variety of tests to determine whether they meet the desired electrical and environmental quality specifications. The problem of quality assurance is accepted and treated as an essential part of the production cycle.

Document Type

Thesis

Language

English

Degree Name

Electrical Engineering

Level of Degree

Masters

Department Name

Electrical and Computer Engineering

First Committee Member (Chair)

Harold D. Southward

Second Committee Member

Roy Arthur Colclaser

Third Committee Member

Shyam H. Gurbaxani

Recommended Citation

Mullis, John L.. "Electrical Parameter Correlations For Radiation Hardness Assurance Of Operational Amplifiers." (1973). https://digitalrepository.unm.edu/ece_etds/620