Electrical and Computer Engineering ETDs

Publication Date

Spring 4-10-2023

Abstract

The coupling of electromagnetic (EM) energy into a system can disrupt operation of essential electronics present within it. Metal enclosures are used to shield these systems from potentially harmful electromagnetic interference (EMI). Seams and gaps in such metal enclosures are minimized but unavoidable for reasons such as maintenance and repair. These seams and gaps create an entry point for EM energy to couple into the system. Entry points are often modeled by EM analysts as narrow slots defined by their length, width, and depth. The depth of these slots can become significant compared to the wavelength, introducing resonances associated with that depth. Quantifying how much energy that could enter the system is essential for system designers. The EM simulation code named Gemma is an electromagnetic full-wave solver developed by Sandia National Laboratories, which implements a subcell model for an electrically deep slot. Typical electromagnetic wave solvers require fine gridding of small features such as slots. A subcell model inserts an element into this grid which is smaller than one cell size and can reduce the required computational resources. Gemma's deep slot model is capable of implementing such a subcell element to capture the relevant physics of EM penetration through a deep slot. The agreement between Gemma's deep slot model and full-wave solvers is strong. However, experimental results found in literature are limited and insufficient for the validation of Gemma's subcell model. This thesis proposes an improved set of experiments that could add strong validity to Gemma's deep slot model.

Keywords

Electromagnetics, Electromagnetic Compatibility, Aperture, Computational Electromagnetics, Deep Slot

Document Type

Thesis

Language

English

Degree Name

Electrical Engineering

Level of Degree

Masters

Department Name

Electrical and Computer Engineering

First Committee Member (Chair)

Viktoriia Babicheva

Second Committee Member

Jane Lehr

Third Committee Member

Arlen S. Heger

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