Electrical and Computer Engineering ETDs

Author

Bernard Hayes

Publication Date

5-17-1960

Abstract

A microwave interferometer technique which may be used as a diagnostic tool for determining the electronic properties of a moving plasma is described and analyzed. The plasma and microwaves are confined in a wave guide and longitudinal observation is employed. The complex reflection coefficient determined from resultant standing-wave pattern provides the means for obtaining the complex dielectric constant, conductivity, electron concentration and collision frequency of electrons with molecules in the plasma. The plasma used for these experiments is the reaction products of a gas detonation.

Document Type

Thesis

Language

English

Degree Name

Electrical Engineering

Level of Degree

Masters

Department Name

Electrical and Computer Engineering

First Committee Member (Chair)

Russell Duff

Second Committee Member

N/A

Third Committee Member

N/A

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