The thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached.
Level of Degree
Electrical and Computer Engineering
First Committee Member (Chair)
Tuttle, John Randall. "An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections." (2012). https://digitalrepository.unm.edu/ece_etds/254